Abstract
Abstract
Wavefront shaping allows light to be focused through scattering objects. However, the wavefront correction found is only valid in a small region called the isoplanatic patch. Here we present a simple approach to extend this isoplanatic patch by shifting and scaling the corrected wavefront appropriately, demonstrating an 8.6-fold increase in the lateral scanning range and a 1.5-fold increase in the axial range through a scattering layer without the need to perform additional wavefront shaping measurements. Our findings agree well with a simple geometrical model that also allows us to extract the effective position of the scattering layer from the measurements.
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@article{Sasikumar2026scanning,
title = {3D scanning microscopy through scattering surfaces using the optical memory effect},
author = {Harish Sasikumar and Gerwin Osnabrugge and Kirsten Gerritsma and Bahareh Mastiani and Ivo M. Vellekoop},
journal = {arXiv (Cornell University)},
year = {2026},
doi = {10.48550/arxiv.2607.14751},
url = {https://doi.org/10.48550/arxiv.2607.14751}
}
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