Electromagnetic Compatibility and Noise Suppression Open access Peer reviewed

Irradiation-Equivalent Injection Test Method for Analyzing HEMP Coupling Effects on Communication Interfaces

Lu Sun, Peihong Wu, Li Yang, Tian Jin and 3 more

Micromachines | Oct 20, 2026

Abstract

Abstract

The E1 component of High-altitude Nuclear Electromagnetic Pulse (HEMP) is an electromagnetic wave with extremely high peak power and fast-rising transient fields that can cause irreversible damage to electronic devices in an extremely short period of time. Traditional irradiation tests used to assess its impact on communication interfaces have problems such as high costs and complex system setup. Moreover, HEMP injection test standards and the actual coupling waveforms of the interfaces have significant differences, which leads to inaccurate electromagnetic coupling effect test results and causes problems through unreasonable design of the protection circuit. This study, in combination with the field-line coupling simulation analysis of communication interface circuits, designs a coupling effect test method for irradiation-equivalent injection without the need for high-cost irradiation equipment. By setting up a test system to conduct equivalent injection tests, taking RS232 communication interfaces as a typical representative, the interference threshold of the interface circuits can be accurately obtained. This enables the implementation of targeted and accurate protective measures to ensure the safe use of electronic devices, and has significant engineering application value.

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Researchers on this paper

Lu Sun

first | Xidian University | ORCID 0000-0003-3928-3223

Peihong Wu

middle | Xidian University

Li Yang

middle | Xidian University | ORCID 0000-0002-1040-4223

Tian Jin

middle | Xidian University | ORCID 0000-0002-4358-3184

Zhenxiao Li

middle | Xidian University

Feifei He

middle | Xidian University

Yang Qiu

last | Xidian University | ORCID 0000-0001-5148-6635

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Citation

BibTeX

@article{Sun2026Irradiation,
  title = {Irradiation-Equivalent Injection Test Method for Analyzing HEMP Coupling Effects on Communication Interfaces},
  author = {Lu Sun and Peihong Wu and Li Yang and Tian Jin and Zhenxiao Li and Feifei He and Yang Qiu},
  journal = {Micromachines},
  year = {2026},
  doi = {10.3390/mi17101205},
  url = {https://doi.org/10.3390/mi17101205}
}

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