FFE-EMC: A FEATURE ENGINEERING–ENHANCED INTELLIGENT FRAMEWORK FOR ELECTROMAGNETIC COMPATIBILITY ASSESSMENT OF ELECTRONIC DEVICES

Abstract

Abstract

With the continuous increase in integration density and operating frequency of modern electronic systems, electromagnetic interference (EMI) problems have become increasingly prominent.Consequently, electromagnetic compatibility (EMC) has become a core indicator for product design and market certification.Traditional EMC evaluation relies on physical testing, which has the disadvantages of high cost and long cycle, and cannot meet the needs of rapid product iteration; existing intelligent evaluation methods lack the guidance of electromagnetic domain knowledge, making it difficult to balance evaluation accuracy and interpretability, and have obvious limitations.To address the above problems, this paper proposes the FFE-EMC intelligent evaluation framework, which integrates feature engineering and intelligent algorithms.It first extracts multi-dimensional raw features, then constructs high-level features with the guidance of electromagnetic domain knowledge and completes adaptive fusion, and finally uses the lightweight gradient boosting tree (L-GBT) algorithm to realize EMC performance prediction.Experimental verification shows that the framework performs excellently in the two core prediction tasks of radiated emission and conducted interference, with root mean square errors (RMSE) of 3.41 dBμV/m for radiated emission and 2.89 dBμV for conducted interference, and corresponding R² values of 0.938 and 0.924 respectively, and its performance is significantly better than that of various mainstream models.The core contribution is a domain-knowledge-guided, featureengineering-enhanced evaluation framework that addresses the inefficiency of traditional physical testing and the lack of accuracy/interpretability in existing intelligent methods.The proposed framework balances computational efficiency and evaluation reliability, offering a promising and cost-effective framework for rapid EMC compliance assessment of electronic devices.