Analog and Mixed-Signal Circuit Design Open access Peer reviewed

Experimental Analysis of Electro-Thermal Gradient Effects in Monolithic LDO Regulators

Andrea Ballo, Samuele Galvagno, ALESSANDRO RIZZO, Giuseppina Bille’ and 2 more

Electronics | Oct 28, 2026

Abstract

Abstract

This paper experimentally investigates the impact of on-chip thermal gradients on the accuracy of a monolithic low-dropout regulator (LDO). Measurements from a silicon prototype show that load-induced temperature gradients introduce systematic, load-dependent reference voltage errors that are not captured by conventional electrical simulations. An analytical electro-thermal model is used to interpret the measured behavior and to identify the dominant physical mechanisms responsible for the observed drift. Experimental results demonstrate that suboptimal layout can lead to reference voltage deviations exceeding 60 mV under full-load conditions, highlighting the limitations of conventional symmetry in mitigating thermal effects. However, by employing the proposed thermally aware floor-planning, this error is successfully reduced to just −6 mV, achieving a one-order-of-magnitude accuracy improvement without altering the electrical schematic. The presented analysis provides design-relevant insights into device placement, biasing, and power stage integration for monolithic power management ICs.

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Authors

Researchers on this paper

Andrea Ballo

first | University of Catania | ORCID 0000-0003-1192-0104

Samuele Galvagno

middle | STMicroelectronics (Italy) | ORCID 0009-0009-1342-2898

ALESSANDRO RIZZO

middle | STMicroelectronics (Italy) | ORCID 0009-0005-3819-4706

Giuseppina Bille’

middle | STMicroelectronics (Italy) | ORCID 0009-0004-9847-4438

Kashif Nisar

middle | University of Catania | ORCID 0000-0001-8092-4665

Salvatore Pennisi

last | University of Catania | ORCID 0000-0002-5803-484X

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Citation

BibTeX

@article{Ballo2026Experimental,
  title = {Experimental Analysis of Electro-Thermal Gradient Effects in Monolithic LDO Regulators},
  author = {Andrea Ballo and Samuele Galvagno and ALESSANDRO RIZZO and Giuseppina Bille’ and Kashif Nisar and Salvatore Pennisi},
  journal = {Electronics},
  year = {2026},
  doi = {10.3390/electronics15214988},
  url = {https://doi.org/10.3390/electronics15214988}
}

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